|
 Burleigh
Instruments, Fishers, NY, calls its new Gemini surface topography
system the first to combine an atomic force microscope (AFM) and an
optical profiler in one package. The Gemini includes Burleigh's Vista
large-sample AFM and Horizon noncontact optical profiler, providing
direct 3D measurements from the millimeter to the angstrom level. The
Vista offers contact, AC, phase, and lateral force imaging modes with
optional scanning tunneling mode. The Horizon offers the capability
to measure areas as large as 2 mm square with a Z range of 100 microns,
while also providing vertical resolution on the angstrom level. Thus
the Gemini measures topographic features, surface roughness, friction,
and compliance.
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