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PTB >>Disk Lasers in the Photovoltaic Industry
Diverse types of lasers, such as nanosecond, pulsed, and excimer, have been considered for various applications in the photovoltaic industry, including edge isolation, edge deletion, drilling for back contact, cutting of Siwafer, and patterning of crystalline solar cells. High power lasers, with high stability and high efficiency in addition to high beam quality, are needed now more than ever. A possible solution to this demand for technology comes in the form of the unique design of the disk laser, which offers power scalability and high beam quality. Understanding the Disk Laser Figure 1 illustrates the design of a disk cavity, where the disk is mounted in the center and pumped by the diode laser light. Today industrial continuous disk lasers are available with an output of up to 5.5 kW from one disk and with an optical efficiency of above 60%. If additional power is necessary, up to four cavities can be used in one resonator. The output power of the laser device increases to a maximum of 16 kW without changing the beam quality. This thin disk technology,
due to its high beam quality and high scalable power, not only allows for cw, but also for high power nanosecond and picosecond lasers. For pulsed operation, various tech nologies can be applied, ranging from q-switched or cavity dumping oscillators to mode-locked Master-Oscillator- Power-Amplifier (MOPA) lasers. Due to the high upper state lifetime of Yb:YAG and the relatively small gain in the thin disk laser, the typical pulse duration of a simple q-switched disk laser is in the order of one microsecond. Through employing a cavity dumped configuration, a wider range of pulse durations is accessible. Hence, the cavity dumped TruMicro 7050 provides tunable pulse width between 25 and 700 nanoseconds and a repetition rate of up to 100 kHz. Using a pockels cell inside the cavity and ejecting the pulses through a thin film polarizer, the laser is able to produce an average output power of 750 watts with a beam quality that allows a core diameter of 100 um or larger in the delivery fiber. Edge Deletion by High-Power Nanosecond Thin Disk Laser The main criterion for acceptance of the edge deletion process is given by the
resistance of the ablated surface, which should be at 100Mô€€± or above. In addition, appearance and cleanness of the ablated area can influence the process setting. Laser ablation of thin layers requires short pulse duration in the nanosecond range with high average power in order to realize an ablation rate in the range of 10 to 50 cm2/s. Due to the facts that the layer structure of the thin film solar cells, the glass substrate, and the cycle time are different, you have to adjust the laser ablation process. Typically, spot diameters between 500 and 1000 um with a pulse to pulse overlap between 5 and 50% and process speed of several meters per second are necessary. With the availability of different core shapes for delivery fibers, an additional degree of freedom appears. Figure 2 shows an ablated area processed with a TruMicro 7050, 620 x 620 um square fiber, and the TRUMPF scanner system Programmable Focus - ing Optic (PFO). The advantage of this square fiber core shape for the application is that we were able to increase the ablation rate by minimizing the pulse overlap and increasing the homogeneity of the ablated area at the same time. Patterning With High-Power Picosecond Thin Disk Laser. New concepts of crystalline silicon solar cells use passivation layers to minimize the recombination rate of electron hole pairs, not only at the front side, but also at the back side of the solar cell. Manufacturers use the dielectric SiOx and SixNy layers between the silicon and the metal contacts. The laser technology allows you to
achieve contact through the isolating passivation layer. There are two ways to do this. Either you use the laser to shoot the metal contacts through the passivation layer onto the wafer, known as laser fired contacts, or you use the laser to remove the insulating layers before the metal coating is applied. With selective removal of the insulating layer, ultra-short pulses operate without added heat creating disruptions in the silicon. Figure 4 shows single shot ablation of a passivation layer on crystalline silicon. Conclusion This article was written by Juergen Stollhof, Technical Sales Manager, and Hoonhee Lee, Application and Project Manager, Micro Processing, TRUMPF Laser Technology Center (Farmington, CT). For more information, contact Mr. Stollhof at juergen.stollhof@ us.trumpf.com, or visit http://info.hotims.com/22926-201. |
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